### Yoni Xiong

**Program Year:**3**Academic Institution:**Vanderbilt University**Field of Study:**Radiation Effects and Reliability**Academic Advisor:**Bharat Bhuva**Practicum(s):**

Sandia National Laboratories, New Mexico (2023)**Degree(s):**

B.E. Electrical Engineering, Vanderbilt University, 2021

#### Publications

Journal Papers:Y. Xiong, N. J. Pieper, N. A. Dodds, G. Vizkelethy, R. N. Nowlin and B. L. Bhuva, Response of 5-nm Bulk FinFET SRAMs to Extreme Ionizing and Non-ionizing Doses, in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2023.3334997.

Y. Xiong et al., Single-Event Upset Cross-Section at High Frequencies for RHBD Flip Flop Designs at the 5-nm Bulk FinFET Node, in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2023.3339329.

N. J. Pieper et al., Temperature Dependence of Critical Charge and Collected Charge in 5-nm FinFET SRAM, in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2023.3336233.

Y. Qian, N. J. Pieper, Y. Xiong, J. Pasternak, D. R. Ball and B. L. Bhuva, SRAM Electrical Variability and SEE Sensitivity at 5-nm Bulk FinFET Technology, in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2023.3326797.

Y. Xiong, N. J. Pieper, A. T. Feeley, B. Narasimham, D. R. Ball and B. L. Bhuva, Single-Event Upset Cross-Section Trends for D-FFs at the 5- and 7-nm Bulk FinFET Technology Nodes, in IEEE Transactions on Nuclear Science, vol. 70, no. 4, pp. 381-386, April 2023, doi: 10.1109/TNS.2022.3226210.

Y. Xiong, N. J. Pieper, M. W. McCurdy, D. R. Ball, B. D. Sierwaski and B. L. Bhuva, Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7- and 5-nm Bulk FinFET Nodes, in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1687-1693, Aug. 2023, doi: 10.1109/TNS.2023.3246085.

Y. Xiong, N. J. Pieper, B. Narasimham, D. R. Ball and B. L. Bhuva, Efficacy of Spatial and Temporal RHBD Techniques at Advanced Bulk FinFET Technology Nodes, in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1814-1820, Aug. 2023, doi: 10.1109/TNS.2023.3246067.

N. J. Pieper, Y. Xiong, J. Pasternak, N. A. Dodds, D. R. Ball and B. L. Bhuva, Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET Technology, in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1673-1679, Aug. 2023, doi: 10.1109/TNS.2023.3240979.

N. J. Pieper et al., Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node, in IEEE Transactions on Nuclear Science, vol. 70, no. 4, pp. 401-409, April 2023, doi: 10.1109/TNS.2023.3240318.

Y. Xiong, A. T. Feeley, D. R. Ball and B. L. Bhuva, Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node, in IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 422-428, March 2022, doi: 10.1109/TNS.2021.3138501.

A. Feeley, Y. Xiong, N. Guruswamy and B. L. Bhuva, Effect of Frequency on Total Ionizing Dose Response of Ring Oscillator Circuits at the 7-nm Bulk FinFET Node, in IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 327-332, March 2022, doi: 10.1109/TNS.2022.3144911.

Y. Xiong et al., Supply Voltage Dependence of Ring Oscillator Frequencies for Total Ionizing Dose Exposures for 7-nm Bulk FinFET Technology, in IEEE Transactions on Nuclear Science, vol. 68, no. 8, pp. 1579-1584, Aug. 2021.

Conference Proceedings:

Y. Xiong, Y. Chiang, N. J. Pieper, D. R. Ball and B. L. Bhuva, Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology, 2023 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2023, pp. 1-6, doi: 10.1109/IRPS48203.2023.10117896.

N. J. Pieper, Y. Xiong, D. R. Ball, J. Pasternak and B. L. Bhuva, Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node, 2023 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2023, pp. 1-6, doi: 10.1109/IRPS48203.2023.10118115.

Y. Xiong et al., Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment, 2022 IEEE International Reliability Physics Symposium (IRPS), 2022, pp. 7C.3-1-7C.3-7.

N. J. Pieper, Y. Xiong, A. Feeley, D. R. Ball and B. L. Bhuva, Single-Event Latchup Vulnerability at the 7-nm FinFET Node, 2022 IEEE International Reliability Physics Symposium (IRPS), 2022, pp. 5C.2-1-5C.2-6.

N. J. Pieper, Y. Xiong, A. Feeley, D. R. Ball and B. L. Bhuva, Single-Event Latchup Vulnerability at the 7-nm FinFET Node, 2022 IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA, 2022, pp. 5C.2-1-5C.2-6, doi: 10.1109/IRPS48227.2022.9764419.

Y. Xiong, A. Feeley, L. W. Massengill, B. L. Bhuva, S.-J. Wen and R. Fung, Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node, 2021 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2021, pp. P34.1-P34.5, doi: 10.1109/IRPS46558.2021.9405128.

A. Feeley, Y. Xiong, B. L. Bhuva, B. Narasimham, S. -J. Wen and R. Fung, Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology, 2021 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2021, pp. P33.1- P33.5, doi: 10.1109/IRPS46558.2021.9405124.

Conference Presentations:

Y. Xiong, N.J. Pieper, Y. Chiang, R. Fung, S.-J. Wen, and B.L. Bhuva, Effects of Scaling on Logic Single-Event Upsets for Advanced Bulk FinFET Technology Nodes Presented at 2023 IEEE Radiation Effects on Components & Systems (RADECS), Oral Presentation, Toulouse, France, Oct. 2023.

N.J. Pieper, Y. Xiong, J. Pasternack, D.R. Ball, Y. Chiang, B.L. Bhuva, Effects of TID on SRAM Stability at the 5-nm Node, Presented at 2023 IEEE Radiation Effects on Components & Systems (RADECS), Oral Presentation, Toulouse, France, Oct. 2023.

Y. Xiong, N.J. Pieper, N. Dodds, G. Vizkelethy, N. Nowlin, B.L. Bhuva, Ion-Induced Stuck Bits in 5-nm bulk FinFET SRAMs at High Fluences, Presented at the 2023 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Kansas City, MO, July 2023.

Y. Xiong, N.J. Pieper, Y. Qian, S. Wodzro, B. Narasimham, R. Fung, S.J. Wen, B.L. Bhuva, SEU Cross-Sections at High Frequencies for RHBD Flip Flop Designs at the 5-nm Bulk FinFET Node, Presented at the 2023 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Kansas City, MO, July 2023.

Y. Qian, N.J. Pieper, Y. Xiong, J. Pasternak, D. Ball, B.L. Bhuva, SRAM Electrical Variability and SEE Sensitivity at 5-nm Bulk FinFET Technology, Presented at the 2023 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Kansas City, MO, July 2023.

N.J Pieper, Y. Xiong, D.R. Ball, R. Fung, S.J. Wen, J. Pasternak, B.L. Bhuva, Temperature Dependence of Single-Event Upsets and Multi-Cell Upsets in 5-nm FinFET SRAMs, Presented at the 2023 Nuclear and Space Radiation Effects Conference (NSREC), Poster Presentation, Kansas City, MO, July 2023.

Y. Xiong, Y. Chiang, N.J. Pieper, D.R. Ball, B.L. Bhuva, Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology, Presented at the 2023 IEEE International Reliability Physics Symposium (IRPS), Oral Presentation, Monterey, CA, March 2023.

N.J. Pieper, Y. Xiong, D.R. Ball, J. Pasternak, B.L. Bhuva, Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node, Presented at the 2023 IEEE International Reliability Physics Symposium (IRPS), Poster Presentation, Monterey, CA, March 2023.

Y. Xiong, N.J. Pieper, M. McCurdy, D.R. Ball, B. Sierawski, B.L. Bhuva, Low-Energy Proton-Induced Single-Event-Upsets at 7-nm and 5-nm Bulk FinFET Nodes, Presented at the 2022 IEEE Radiation Effects on Components & Systems (RADECS), Oral Presentation, Venice, Italy, Oct. 2022.

Y. Xiong, N.J. Pieper, D.R. Ball, B. Narasimham, B.L. Bhuva, Efficacy of RHBD techniques at the 5-nm and 7-nm Bulk FinFET Technologies, Presented at the 2022 IEEE Radiation Effects on Components & Systems (RADECS), Oral Presentation, Venice, Italy, Oct. 2022.

N.J. Pieper, Y. Xiong, J. Pasternack, N.A. Dodds, B.L. Bhuva, Comparison of Single Port and Two Port SRAM Single Event Vulnerability for the 5-nm FinFET Technology, Presented at the 2022 IEEE Radiation Effects on Components & Systems (RADECS), Oral Presentation, Venice, Italy, Oct. 2022.

Y. Xiong, N.J. Pieper, A.T. Feeley, D.R. Ball, B. Narasimham, B.L. Bhuva, Scaling Trends for Single Event Cross-Section for Conventional D-FFs at Bulk FinFET Technology Nodes, Presented at the 2022 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Provo, UT, July 2022.

N.J. Pieper, Y. Xiong, A.T. Feeley, J. Pasternack, B.L. Bhuva, SRAM Multi-Cell Upset Vulnerability at the 5-nm FinFET Node, Presented at the 2022 Nuclear and Space Radiation Effects Conference (NSREC), Poster Presentation, Provo, UT, July 2022.

Y. Xiong, A.T. Feeley, N.J. Pieper, D.R. Ball, B. Narasimham, J. Brockman, N.A. Dodds, S. Wender, S.J. Wen, R. Fung, B.L. Bhuva, Soft Error Characterization of D-FFs at the 5 nm Bulk FinFET Technology for the Terrestrial Environment, Presented at the 2022 IEEE International Reliability Physics Symposium (IRPS), Oral Presentation, Dallas, TX, March 2022.

N. Pieper, Y. Xiong, A.T. Feeley, D.R. Ball, B.L. Bhuva, Latchup Vulnerability at the 7-nm FinFET node, Presented at the 2022 IEEE International Reliability Physics Symposium (IRPS), Oral Presentation, Dallas, TX, March 2022.

Y. Xiong, A.T. Feeley, D.R. Ball, L.W. Massengill, B.L. Bhuva, Modeling Single-Event Cross-Sections for Logic Circuits at the 7-nm Bulk FinFET Technology Node, Presented at the 2021 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Online, July 2021

Y. Xiong, A.T. Feeley, S.J. Wen, R. Fung, L.W. Massengill, and B.L. Bhuva, Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node, Presented at the 2021 IEEE International Reliability Physics Symposium (IRPS), Poster presentation, Monterey, CA, March 2021.

A.T. Feeley, Y. Xiong, B. Narasimham, S.J. Wen, R. Fung, and B.L. Bhuva, Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology, Presented at the 2021 IEEE International Reliability Physics Symposium (IRPS), Poster presentation, Monterey, CA, March 2021.

Y. Xiong, A.T. Feeley, P. Wang, X. Li, L.W.

#### Awards

IEEE NSREC 2023 Meritorious Paper AwardIEEE IRPS 2023 Best Oral Presentation

IEEE NPSS Paul Phelps Continuing Education Grant 2022

IEEE NSREC 2022 Best Student Paper Award

Russell G. Hamilton Scholar: 2021-2023

DOE NNSA SSGF: 2021-2023

Dean's List Award, Vanderbilt University: 2019-2017

Cornelius Vanderbilt Scholarship: 2021-2017

Vanderbilt Summer Research Program: 2019

Devon Energy Scholarship: 2021-2017

National Merit Scholar: 2017