Yoni Xiong

  • Program Year: 1
  • Academic Institution: Vanderbilt University
  • Field of Study: Radiation Effects and Reliability
  • Academic Advisor: Bharat Bhuva
  • Practicum(s): Practicum Not Yet Completed
  • Degree(s):
    B.E. Electrical Engineering, Vanderbilt University, 2021

Publications

Journal Papers:
Y. Xiong, A. Feeley, D. Ball, B.L. Bhuva, "Modeling Logic Error Single-Event Cross-Sections at the 7-nm Bulk FinFET Technology Node," Submitted to IEEE Transactions on Nuclear Science, July 2021.

A. Feeley, Y. Xiong, N. Guruswamy and B. L. Bhuva,"Effect of Frequency on Total Ionizing Dose Response of Ring Oscillator Circuits at the 7-nm Bulk FinFET Node." Submitted to IEEE Transactions on Nuclear Science, July 2021.

Y. Xiong et al., "Supply Voltage Dependence of Ring Oscillator Frequencies for Total Ionizing Dose Exposures for 7-nm Bulk FinFET Technology," in IEEE Transactions on Nuclear Science, vol. 68, no. 8, pp. 1579-1584, Aug. 2021.

Conference Proceedings:
Y. Xiong, A. Feeley, N. Pieper, D. Ball, B. Narasimham, J. Brockman, N. Dodds, S. Wender, S.J Wen, R. Fung, B.L. Bhuva, "Soft Error Characterization for 5-nm Bulk FinFET Technology in Terrestrial Environment," Submitted to 2022 IEEE International Reliability Physics Symposium (IRPS), Oct. 2021.

Y. Xiong, A. Feeley, N. Pieper, D. Ball, B.L. Bhuva, "Soft Error Performance at Near-Threshold Supply Voltages for Hardened and Unhardened Flip-Flop Designs in 7-nm Bulk FinFET Technology," Submitted to 2022 IEEE International Reliability Physics Symposium (IRPS), Oct. 2021.

A. Feeley, Y. Xiong, N. Pieper, B. Narasimham, B.L. Bhuva, "Temperature Dependence of Soft Errors in 5-nm, 7-nm, and 16-nm Bulk FinFET Technology," Submitted to 2022 IEEE International Reliability Physics Symposium (IRPS), Oct. 2021.

N. Pieper, Y. Xiong, A. Feeley, D. Ball, B.L. Bhuva, "Latchup Vulnerability at the 7-nm FinFET Node," Submitted to 2022 IEEE International Reliability Physics Symposium (IRPS), Oct. 2021.

Xiong Y., Feeley A., Massengill L. W., Bhuva B. L., Wen S. . -J., and Fung R., "Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node," 2021 IEEE International Reliability Physics Symposium (IRPS), 2021, pp. 1-5.

Feeley A., Xiong Y., Bhuva B. L., Narasimham B., Wen S. . -J., and Fung R., "Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology," 2021 IEEE International Reliability Physics Symposium (IRPS), 2021, pp. 1-5.

Conference Presentations:
Xiong Y., Feeley A., Ball D. R., Massengill L.W., Bhuva B.L., Modeling Single-Event Cross-Sections for Logic Circuits at the 7-nm Bulk FinFET Technology Node, Presented at the at Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Online, July 2021

Xiong Y., Feeley A., Wen S.-J., Fung R., Massengill L.W., and Bhuva B.L., Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node, Presented at the 2021 IEEE International Reliability Physics Symposium (IRPS), Poster presentation, Monterey, CA, March 2021.

Feeley A., Xiong Y., Narasimham B., Wen S.-J., Fung R., and Bhuva B.L., Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology, Presented at the 2021 IEEE International Reliability Physics Symposium (IRPS), Poster presentation, Monterey, CA, March 2021.

Xiong Y., Feeley A., Wang P., Li X., Massengill L.W., and Bhuva B.L., Supply Voltage Dependence of RO Frequencies for Total Ionizing Dose Exposures for 7nm Bulk FinFET Technology, Presented at the 2020 IEEE Radiation Effects on Components & Systems (RADECS), Oral presentation, September 2020.

Awards

Dean's List Award, Vanderbilt University: 2019-2017
National Merit Scholar: 2017
Cornelius Vanderbilt Scholarship: 2021-2017
Vanderbilt Summer Research Program: 2019
Devon Energy Scholarship: 2021-2017
Russell G. Hamilton Scholar: 2021
DOE NNSA SSGF: 2021