Program Years:
2021–2025
University:
Vanderbilt University
Field of Study:
Radiation Effects and Reliability
Advisor:
Bharat Bhuva
Degree(s):
B.E. Electrical Engineering, Vanderbilt University, 2021
Practicum Experience(s)
Sandia National Laboratories, New Mexico (2023)
Practicum Supervisor(s):
Nathan
Nowlin
Practicum Title:
Investigation of stuck bits in commercial 5-nm bulk FinFET SRAMs
Current Status
Research Area:
Radiation Effects and Reliability
Annual Program Review Abstracts
Fellow Presentation
:
Assessment of Single-Particle Displacement Damage in 14-nm and 5-nm FinFET SRAMs
(2025
)