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Towards Ultimate Sensitivity: Precision Mass Measurements from a Single Ion

Presenter:
Scott
Campbell
Profile Link:
University:
Michigan State University
Program:
SSGF
Year:
2025

Precision mass measurements of rare isotopes are an essential input for almost all areas of nuclear physics research. Of particular interest are measurements for the most exotic nuclei produced at the limits of modern radioactive beam facilities. Measurements with meaningful precision are often inaccessible due to half-life limitations and the required ~100 ions to complete a measurement. The Low Energy Beam Ion Trap group at the Facility for Rare Isotope Beams specializes in Penning trap mass spectrometry (PTMS): the most precise mass measurement method. The Single Ion Penning Trap (SIPT) project uses a novel application of PTMS which, in principle, can provide a complete mass measurement from a single ion. Recent advancements in analysis along with improved detection schemes have provided experimental validation for single ion sensitivity. An overview of the project, current developments, and future perspectives will be presented.